1
Assuntos:
“...Reliability...”
Three different techniques to cope with radiation effects and component variability in future technologies
Tese
2
Assuntos:
“...Reliability...”
Enhancements on fault injection for xilinx 7 series and ultrascale+ SRAM-based FPGAs
Tese
3
Assuntos:
“...Reliability...”
A reliability- and variation-aware methodology for improved processor designs for the edge computing domain
Tese