1
Assuntos:
“...Reliability...”
Increasing embedded software radiation reliability through cache memories
Dissertação
2
Assuntos:
“...Reliability assessment...”
A framework for reliability assessment in expansion planning of power distribution systems
Dissertação
3
Assuntos:
“...Reliability...”
Lateral analysis of gas reinjection compressors with uncertainties on bearings coefficients
Dissertação
4
Assuntos:
“...Power electronics reliability...”
Multi-objective design tool for optimizing capacitor selection in power converters based on the mission profile
Tese
5
Assuntos:
“...Reliability...”
Novel and faster ways for solving semi-markov processes: mathematical and numerical issues
Tese
6
Assuntos:
“...Human reliability analysis...”
A methodology for human reliability analysis of oil refinery and petrochemical operations: the hero (human error in refinery operations) hra methodology
Tese
7
Assuntos:
“...Reliability...”
A Fast Approximate Function Generation Technique to ATMR Design
Dissertação
8
Assuntos:
“...Power electronics reliability...”
Multi-objective design tool for optimizing capacitor selection in power converters based on the mission profile
Tese
9
Assuntos:
“...Reliability...”
Understanding and improving GPUs’ reliability combining beam experiments with fault simulation
Tese
10
11
Assuntos:
“...Reliability...”
Intra and inter-rater reliability of triceps surae morphological and mechanical properties in healthy subjects
Dissertação
12
Assuntos:
“...Reliability...”
Modeling and simulation of self-heating effects in p-type MOS transistors
Tese
13
Assuntos:
“...reliability...”
Circuit-level approaches to mitigate the process variability and soft errors in finFET logic cells
Tese
14
Assuntos:
“...Reliability...”
The effects of the compiler optimizations in embedded processors reliability
Dissertação
15
Assuntos:
“...Embedded Processors Reliability...”
Applying dual core lockstep in embedded processors to mitigate radiation induced soft errors
Dissertação
16
Assuntos:
“...Reliability...”
Three different techniques to cope with radiation effects and component variability in future technologies
Tese
17
Assuntos:
“...Reliability...”
Aging aware design techniques and CMOS gate degradation estimative
Tese
18
Assuntos:
“...Reliability...”
CMOS digital integrated circuit design faced to NBTI and other nanometric effects
Dissertação
19
20
Assuntos:
“...Reliability...”
Enhancements on fault injection for xilinx 7 series and ultrascale+ SRAM-based FPGAs
Tese