1
Assuntos:
“...Single Event Effects...”
Use of approximate triple modular redundancy for fault tolerance in digital circuits
Tese
2
Assuntos:
“...Single-Event-Induced Charge Sharing...”
Investigating techniques to reduce soft error rate under single-event-induced charge sharing
Dissertação
3
Assuntos:
“...Single-event effects...”
Enhancements on fault injection for xilinx 7 series and ultrascale+ SRAM-based FPGAs
Tese
4
Assuntos:
“...Single event effects...”
Selective software-implemented hardware fault tolerance tecnhiques to detect soft errors in processors with reduced overhead
Tese