1
Assuntos:
“...Single-event effects...”
Enhancements on fault injection for xilinx 7 series and ultrascale+ SRAM-based FPGAs
Tese
2
Assuntos:
“...Single event transient modeling...”
Reliability evaluation of finFET-based SRAMs in the presence of resistive defects
Tese
3
Assuntos:
“...Single event upsets...”
Frame-level redundancy scrubbing technique for SRAM-based FPGAs
Tese
4
Assuntos:
“...Single event effects...”
Selective software-implemented hardware fault tolerance tecnhiques to detect soft errors in processors with reduced overhead
Tese