Buscas alternativas:
duration algorithm » extraction algorithm (Expandir a busca), adaptation algorithm (Expandir a busca), detection algorithm (Expandir a busca)
parallel process » parallel processes (Expandir a busca), parallel processing (Expandir a busca), parallel processors (Expandir a busca)
process duration » process education (Expandir a busca), process migration (Expandir a busca), process simulation (Expandir a busca)
algorithm global » algorithm sebal (Expandir a busca), algorithm ga (Expandir a busca), algorithm social (Expandir a busca)
global method » global methods (Expandir a busca), local method (Expandir a busca), nodal method (Expandir a busca)
duration algorithm » extraction algorithm (Expandir a busca), adaptation algorithm (Expandir a busca), detection algorithm (Expandir a busca)
parallel process » parallel processes (Expandir a busca), parallel processing (Expandir a busca), parallel processors (Expandir a busca)
process duration » process education (Expandir a busca), process migration (Expandir a busca), process simulation (Expandir a busca)
algorithm global » algorithm sebal (Expandir a busca), algorithm ga (Expandir a busca), algorithm social (Expandir a busca)
global method » global methods (Expandir a busca), local method (Expandir a busca), nodal method (Expandir a busca)
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“..., custos e Testabilidade de circuitos VLSI verificou-se que o custo associado ao processo de testes...”
Algoritmos de otimização de planos de teste de unidades funcionais para circuitos BIST.
Dissertação