Solu??o do problema inverso da tomografia por imped?ncia el?trica utilizando o simulated annealing : uma nova abordagem

• Ano de defesa: 2016
• Autor(a) principal: Martins, Jefferson Santana
• Orientador(a): Vargas, Rubem Mario Figueiro
• Tipo de documento: Tese
• Tipo de acesso: Acesso aberto
• Idioma: por
• Instituição de defesa: Pontif?cia Universidade Cat?lica do Rio Grande do Sul
• Programa de Pós-Graduação: Programa de P?s-Gradua??o em Engenharia e Tecnologia de Materiais
• Departamento: Faculdade de Engenharia
• País: Brasil
• Palavras-chave em Português: TOMOGRAFIA; IMPED?NCIA (ELETRICIDADE); ALGORITMOS; M?TODOS NUM?RICOS; ENGENHARIA DE MATERIAIS
• Área do conhecimento CNPq: ENGENHARIAS
• Link de acesso: http://tede2.pucrs.br/tede2/handle/tede/6625

Image reconstruction in electrical impedance tomography (EIT) deals with an ill-posed and nonlinear inverse problem. It intends to minimize the difference between simulated (virtual) object data and data from a non simulated (real) object. In this paper, a new approach to the Simulated Annealing method applied to reconstruction of EIT images is described. The main advantage in this approach is that all conductivity parameters are updated simultaneously. Other methods that employ Simulated Annealing to the problem of EIT evaluate each conductivity parameter individually resulting in high computational cost. The algorithm was tested both with computationally generated data and with measurements performed on a physical simulation tank. In both cases, the method was able to make data inversion, determining the position, the dimensions and the conductivity of materials in an opaque object plane.