Silício mitiga estresse por deficiência nutricional em plantas de quinoa (Chenopodium quinoa Willd)

• Ano de defesa: 2021
• Autor(a) principal: Ana Carolina Sales
• Orientador(a): Cid Naudi Silva Campos
• Tipo de documento: Dissertação
• Tipo de acesso: Acesso aberto
• Idioma: por
• Instituição de defesa: Fundação Universidade Federal de Mato Grosso do Sul
• País: Brasil
• Palavras-chave em Português: Silício mitiga estresse por deficiência nutricional em plantas de quinoa (Chenopodium quinoa Willd)
• Link de acesso: https://repositorio.ufms.br/handle/123456789/3665

Nutritional deficiency is common in several regions of quinoa cultivation. Silicon (Si) can attenuate the stress caused by nutritional deficiency, but studies on the effects of Si supply on quinoa plants are still scarce. Given this scenario, our objective was to evaluate the symptoms in terms of tissue, physiological and nutritional effects of quinoa plants submitted to nitrogen (N), phosphorus (P), potassium (K), calcium (Ca), and magnesium (Mg) deficiencies under Si presence. The experiment consisted of a factorial scheme 6 x 2, using a complete solution (CS), -N, -P, -K, -Ca, -Mg combined with absence and presence of Si (1.5 mmol L-1). Symptomatic, physiological, nutritional and yield evaluations were performed in quinoa crop. The deficiencies of N, P, K, Ca and Mg in quinoa cultivation caused visual symptoms characteristic of the deficiency caused by respective nutrients, hence decreasing the plant dry mass. However, Si supply attenuated the deficiency effects by preserving the photosynthetic apparatus, increasing the chlorophyll production, increasing the membrane integrity, and decreasing the electrolyte leakage. Thus, the Si supply attenuated the visual effects provided by deficiency of all nutrients, but stood out for N and Ca, because it reflected in a higher dry mass production. This occurred because, the Si promoted higher synthesis and protection of chlorophylls, and lower electrolyte leakage under Ca restriction, as well as decreased electrolyte leakage under N restriction.