Teste de condutividade elétrica para sementes de milho e de soja armazenadas sob baixa temperatura

• Ano de defesa: 2009
• Autor(a) principal: Rosa, Mariana Silva [UNESP]
• Tipo de documento: Dissertação
• Tipo de acesso: Acesso aberto
• Idioma: por
• Instituição de defesa: Universidade Estadual Paulista (Unesp)
• Palavras-chave em Português: Sementes - Armazenamento; Sementes - Deterioração; Soja; Milho; Repouso de sementes; Vigor; Glycine max; Zea mays; Seed storage; Vigour; deterioration; Rest time of seeds
• Link de acesso: http://hdl.handle.net/11449/96802

Electrical conductivity test is recommended to evaluate vigor of pea seeds and suggested for soybean. However, some cares must be taken for this test, when conducted for seeds stored at low temperature. Thus, the present work was carried out in order to verify if the use of rest time at higher temperature of seeds before the imbibitions for the electrical conductivity test can increase the viability of the test for maize and soybean seeds, stored at 10 °C. Five seed lots for each species, with similar germination levels were used. After the initial evaluations, soybean seed lots were stored during 15 months and maize seed lots during 16 months at low temperature. The laboratory analysis (seed moisture content; germination and vigor: accelerated aging; cold and electrical conductivity tests) were performed initially and repeated periodically after the storage (10 °C and 60% of air relative humidity) at 3, 6, 9, 12 and 15 months for soybean and 4, 8, 12 and 16 months for maize. Since the second evaluation for both species a new variable was added to the electrical conductivity test, denominated rest time of the seeds, used between the removal of the seeds of the cold chamber and the start of the imbibition for the conductivity test. The rest time periods of 0, 6, 12 and 24 hours were used, at two temperatures, 20 e 25 to 30 °C, aimed to verify, in this way, the effect of these periods and temperatures on the results of the electrical conductivity throughout of the storage period at low temperature.