Error Correction Codes Based on Region Selection Codes

Detalhes bibliográficos
Ano de defesa: 2023
Autor(a) principal: Silva, Felipe Gaspar Alan e
Orientador(a): Silveira, Jarbas Aryel Nunes da
Banca de defesa: Não Informado pela instituição
Tipo de documento: Tese
Tipo de acesso: Acesso aberto
Idioma: eng
Instituição de defesa: Não Informado pela instituição
Programa de Pós-Graduação: Não Informado pela instituição
Departamento: Não Informado pela instituição
País: Não Informado pela instituição
Área do conhecimento CNPq:
Link de acesso: http://repositorio.ufc.br/handle/riufc/76792
Resumo: The continuous decrease in the scale of transistors spurred the advent of System-on-Chips (SoCs), allowing the insertion of more computational logic in an integrated circuit (IC), increasing its processing capacity and functionalities. However, this process made electronic devices more susceptible to external effects, mainly radiation. Among modern ICs, memory circuits (e.g., SRAM and DRAM) are very susceptible to radiation effects, and may present different types of failures, with multiple-bit inversion (MBUs) and stored information corruption being the most recurrent types. In this context, Error Correction Codes (ECCs) have been widely used to increase the reliability of data stored in memory. ECCs with linear and matrix format excel in two-dimensional memories. Linear format codes have one dimension and are used to protect a dataset in this single dimension. Array format codes are two-dimensional, protecting an array of data. This thesis had the goal of developing a set of ECCs based on Region Selection Code (RSC), which consists of separating memory data into regions, and through logical operations and simple steps to perform MBU corrections. The first ECC developed was the Matrix Region Selection Code (MRSC), a matrix format code that was developed for adjacent error correction, managing to correct 100% of 2-bit errors. Two other extension approaches were developed: Extended Matrix Region Selection Code (eMRSC) and Triple Burst Error Corrector - Region Selection Code (TBEC-RSC). eMRSC is also an extension of the matrix format, but with two configurations: one with greater error correction capability and another with a smaller number of redundancy bits. TBEC-RSC is a proposed extension to linear format, able to correct up to 3-bit burst errors. All proposals were compared with other works in the area considering correction capacity, reliability and synthesis cost. Finally, the results collected from experiments showed that ECCs based on RSC logic showed excellent error correction capability and good reliability rates (e.g., TBEC-RSC corrected approximately 40% of 8-bit burst errors), also characterized by low synthesis cost (e.g., MRSC consumed 91.2% less power than the Reed-Muller code), which made them have the best ratio of correction coverage per synthesis cost among the compared ECCs.
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spelling Silva, Felipe Gaspar Alan eMarcon, César Augusto MissioSilveira, Jarbas Aryel Nunes da2024-04-16T17:17:56Z2024-04-16T17:17:56Z2023-06-02SILVA, F. G. A.Error Correction Codes Bases on Region Selection Codes. 2023. 90 f. Tese (Doutorado em Engenharia de Teleinformática) – Centro de Tecnologia, Universidade Federal do Ceará, Fortaleza, 2023.http://repositorio.ufc.br/handle/riufc/76792The continuous decrease in the scale of transistors spurred the advent of System-on-Chips (SoCs), allowing the insertion of more computational logic in an integrated circuit (IC), increasing its processing capacity and functionalities. However, this process made electronic devices more susceptible to external effects, mainly radiation. Among modern ICs, memory circuits (e.g., SRAM and DRAM) are very susceptible to radiation effects, and may present different types of failures, with multiple-bit inversion (MBUs) and stored information corruption being the most recurrent types. In this context, Error Correction Codes (ECCs) have been widely used to increase the reliability of data stored in memory. ECCs with linear and matrix format excel in two-dimensional memories. Linear format codes have one dimension and are used to protect a dataset in this single dimension. Array format codes are two-dimensional, protecting an array of data. This thesis had the goal of developing a set of ECCs based on Region Selection Code (RSC), which consists of separating memory data into regions, and through logical operations and simple steps to perform MBU corrections. The first ECC developed was the Matrix Region Selection Code (MRSC), a matrix format code that was developed for adjacent error correction, managing to correct 100% of 2-bit errors. Two other extension approaches were developed: Extended Matrix Region Selection Code (eMRSC) and Triple Burst Error Corrector - Region Selection Code (TBEC-RSC). eMRSC is also an extension of the matrix format, but with two configurations: one with greater error correction capability and another with a smaller number of redundancy bits. TBEC-RSC is a proposed extension to linear format, able to correct up to 3-bit burst errors. All proposals were compared with other works in the area considering correction capacity, reliability and synthesis cost. Finally, the results collected from experiments showed that ECCs based on RSC logic showed excellent error correction capability and good reliability rates (e.g., TBEC-RSC corrected approximately 40% of 8-bit burst errors), also characterized by low synthesis cost (e.g., MRSC consumed 91.2% less power than the Reed-Muller code), which made them have the best ratio of correction coverage per synthesis cost among the compared ECCs.A continua diminuição em escala dos transistores impulsionou o advento de sistemas intra-chip, em inglês System-on-Chips (SoCs), permitindo a inserção de mais lógica computacional em um circuito integrado (CI), aumentando sua capacidade de processamento e funcionalidades. No entanto, esse processo tornou os dispositivos eletrônicos mais susceptíveis a efeitos externos, principalmente radiação. Dentre os CIs modernos, circuitos de memória (e.g., SRAM e DRAM) são bastante susceptíveis a efeitos de radiação, podendo apresentar diversos tipos de falhas, sendo inversão de múltiplos bits (MBUs) e corrupção da informação armazenada os tipos mais reincidentes. Nesse contexto, códigos corretores de erros, em inglês Error Correction Codes (ECCs), têm sido amplamente utilizados para aumentar a confiabilidade dos dados armazenados em memória. ECCs com formato linear e matricial se destacam em memórias de duas dimensões. Códigos de formato linear têm uma dimensão e são usados para proteger um conjunto de dados armazenados em uma dimensão (e.g. um endereço de memory). Códigos de formato matricial têm duas dimensões, protegendo uma matriz de dados (e.g. mais de um endereço de memória). Esta tese teve como objetivo desenvolver um conjunto de ECCs baseado em códigos de seleção de região, em inglês Region Selection Code (RSC), que consiste em separar os dados de memória em regiões, e através de operações lógicas e passos simples realizar correções de MBUs. O primeiro ECC desenvolvido foi o Matrix Region Selection Code (MRSC), um código de formato matricial e que foi desenvolvido para a correção de erros adjacentes, conseguindo corrigir 100% de 2-bit erros. Outras duas abordagens de extensão foram desenvolvidas: Extended Matrix Region Selection Code (eMRSC) e Triple Burst Error Corrector - Region Selection Code (TBEC-RSC). O eMRSC é uma extensão também de formato matricial, mas apresentando duas configurações: uma com maior capacidade de correção de erros e outra com menor número de bits de redundância. O TBEC-RSC é uma extensão proposta para formato linear, conseguindo corrigir até 3-bit erros em rajada. Todas as propostas foram comparadas com outros trabalhos da área considerando capacidade de correção, confiabilidade e custo de síntese. Por fim, os resultados coletados dos experimentos mostraram que os ECCs baseados na lógica RSC apresentaram excelente capacidade de correção de erros e bons índices de confiabilidade (e.g., TBEC-RSC corrigiu aproximadamente 40% de 8-bit burst erros), também se caracterizaram por baixo custo de síntese (e.g., MRSC consumiu 91,2% menos potência que o código Reed-Muller), o que os fizeram ter a melhor relação de cobertura de correção por custo de síntese dentre os ECCs comparados.Silva, F. G. A. Error Correction Codes Bases on Region Selection Codes. 2023. 90 f. Tese (Doutorado em Engenharia de Teleinformática) – Centro de Tecnologia, Universidade Federal do Ceará, Fortaleza, 2023.Error Correction Codes Based on Region Selection CodesError Correction Codes Based on Region Selection Codesinfo:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/doctoralThesisCódigos Corretores de ErrosTolerância a FalhasConfiabilidade de MemóriasEventos de efeito únicoError Correction CodesFault ToleranceMemory ReliabilitySingle Event EffectsCNPQ::ENGENHARIAS::ENGENHARIA ELETRICAinfo:eu-repo/semantics/openAccessengreponame:Repositório Institucional da Universidade Federal do Ceará (UFC)instname:Universidade Federal do Ceará (UFC)instacron:UFChttp://lattes.cnpq.br/6357523181613649http://lattes.cnpq.br/0406937598151848http://lattes.cnpq.br/86110202427638282024-01-15ORIGINAL2023_tese_fgasilva.pdf2023_tese_fgasilva.pdfTeseapplication/pdf2354220http://repositorio.ufc.br/bitstream/riufc/76792/7/2023_tese_fgasilva.pdf1bd6738ae3a156f3733015567864684bMD57LICENSElicense.txtlicense.txttext/plain; charset=utf-81748http://repositorio.ufc.br/bitstream/riufc/76792/8/license.txt8a4605be74aa9ea9d79846c1fba20a33MD58riufc/767922024-04-16 14:17:56.931oai:repositorio.ufc.br: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Repositório InstitucionalPUBhttp://www.repositorio.ufc.br/ri-oai/requestbu@ufc.br || repositorio@ufc.bropendoar:2024-04-16T17:17:56Repositório Institucional da Universidade Federal do Ceará (UFC) - Universidade Federal do Ceará (UFC)false
dc.title.pt_BR.fl_str_mv Error Correction Codes Based on Region Selection Codes
dc.title.en.pt_BR.fl_str_mv Error Correction Codes Based on Region Selection Codes
title Error Correction Codes Based on Region Selection Codes
spellingShingle Error Correction Codes Based on Region Selection Codes
Silva, Felipe Gaspar Alan e
CNPQ::ENGENHARIAS::ENGENHARIA ELETRICA
Códigos Corretores de Erros
Tolerância a Falhas
Confiabilidade de Memórias
Eventos de efeito único
Error Correction Codes
Fault Tolerance
Memory Reliability
Single Event Effects
title_short Error Correction Codes Based on Region Selection Codes
title_full Error Correction Codes Based on Region Selection Codes
title_fullStr Error Correction Codes Based on Region Selection Codes
title_full_unstemmed Error Correction Codes Based on Region Selection Codes
title_sort Error Correction Codes Based on Region Selection Codes
author Silva, Felipe Gaspar Alan e
author_facet Silva, Felipe Gaspar Alan e
author_role author
dc.contributor.co-advisor.none.fl_str_mv Marcon, César Augusto Missio
dc.contributor.author.fl_str_mv Silva, Felipe Gaspar Alan e
dc.contributor.advisor1.fl_str_mv Silveira, Jarbas Aryel Nunes da
contributor_str_mv Silveira, Jarbas Aryel Nunes da
dc.subject.cnpq.fl_str_mv CNPQ::ENGENHARIAS::ENGENHARIA ELETRICA
topic CNPQ::ENGENHARIAS::ENGENHARIA ELETRICA
Códigos Corretores de Erros
Tolerância a Falhas
Confiabilidade de Memórias
Eventos de efeito único
Error Correction Codes
Fault Tolerance
Memory Reliability
Single Event Effects
dc.subject.ptbr.pt_BR.fl_str_mv Códigos Corretores de Erros
Tolerância a Falhas
Confiabilidade de Memórias
Eventos de efeito único
dc.subject.en.pt_BR.fl_str_mv Error Correction Codes
Fault Tolerance
Memory Reliability
Single Event Effects
description The continuous decrease in the scale of transistors spurred the advent of System-on-Chips (SoCs), allowing the insertion of more computational logic in an integrated circuit (IC), increasing its processing capacity and functionalities. However, this process made electronic devices more susceptible to external effects, mainly radiation. Among modern ICs, memory circuits (e.g., SRAM and DRAM) are very susceptible to radiation effects, and may present different types of failures, with multiple-bit inversion (MBUs) and stored information corruption being the most recurrent types. In this context, Error Correction Codes (ECCs) have been widely used to increase the reliability of data stored in memory. ECCs with linear and matrix format excel in two-dimensional memories. Linear format codes have one dimension and are used to protect a dataset in this single dimension. Array format codes are two-dimensional, protecting an array of data. This thesis had the goal of developing a set of ECCs based on Region Selection Code (RSC), which consists of separating memory data into regions, and through logical operations and simple steps to perform MBU corrections. The first ECC developed was the Matrix Region Selection Code (MRSC), a matrix format code that was developed for adjacent error correction, managing to correct 100% of 2-bit errors. Two other extension approaches were developed: Extended Matrix Region Selection Code (eMRSC) and Triple Burst Error Corrector - Region Selection Code (TBEC-RSC). eMRSC is also an extension of the matrix format, but with two configurations: one with greater error correction capability and another with a smaller number of redundancy bits. TBEC-RSC is a proposed extension to linear format, able to correct up to 3-bit burst errors. All proposals were compared with other works in the area considering correction capacity, reliability and synthesis cost. Finally, the results collected from experiments showed that ECCs based on RSC logic showed excellent error correction capability and good reliability rates (e.g., TBEC-RSC corrected approximately 40% of 8-bit burst errors), also characterized by low synthesis cost (e.g., MRSC consumed 91.2% less power than the Reed-Muller code), which made them have the best ratio of correction coverage per synthesis cost among the compared ECCs.
publishDate 2023
dc.date.issued.fl_str_mv 2023-06-02
dc.date.accessioned.fl_str_mv 2024-04-16T17:17:56Z
dc.date.available.fl_str_mv 2024-04-16T17:17:56Z
dc.type.status.fl_str_mv info:eu-repo/semantics/publishedVersion
dc.type.driver.fl_str_mv info:eu-repo/semantics/doctoralThesis
format doctoralThesis
status_str publishedVersion
dc.identifier.citation.fl_str_mv SILVA, F. G. A.Error Correction Codes Bases on Region Selection Codes. 2023. 90 f. Tese (Doutorado em Engenharia de Teleinformática) – Centro de Tecnologia, Universidade Federal do Ceará, Fortaleza, 2023.
dc.identifier.uri.fl_str_mv http://repositorio.ufc.br/handle/riufc/76792
identifier_str_mv SILVA, F. G. A.Error Correction Codes Bases on Region Selection Codes. 2023. 90 f. Tese (Doutorado em Engenharia de Teleinformática) – Centro de Tecnologia, Universidade Federal do Ceará, Fortaleza, 2023.
url http://repositorio.ufc.br/handle/riufc/76792
dc.language.iso.fl_str_mv eng
language eng
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reponame_str Repositório Institucional da Universidade Federal do Ceará (UFC)
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